A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2017; you can also visit the original URL.
The file type is application/pdf
.
Penta-Prism Long Trace Profiler (PPLTP) for measurement of grazing incidence space optics
1996
Multilayer and Grazing Incidence X-Ray/EUV Optics III
The Long Trace Profrler (LTP) is in use at a number of locations throughout the world for the measurement of the figure and mid-frequency roughness of x-ray mirrors. The standard configuration requires that the surface tested lie in a horizontal plane as the optical head is scanned along a horizontal line. For applications where gravity-induced sag of the surface cannot be tolerated, such as in x-ray telescope mirror metrology, it is desirable to measure the mirror as it is mounted in a
doi:10.1117/12.245083
fatcat:nwqw35233ff4thkajwjndvjcoi