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Prediction of grain-boundary migration by Monte Carlo simulation in an aluminum foil for electrolytic capacitor
電解コンデンサ用アルミニウム箔材におけるMCシミュレーションによる粒界移動予測
2002
Keikinzoku/Journal of Japan Institute of Light Metals
電解コンデンサ用アルミニウム箔材におけるMCシミュレーションによる粒界移動予測
Masakazu KOBAYASHI , Yoshimasa TAKAYAMA and Hajime KATO In order to control orientation distributions or texture in polycrystalline materials, it is important to study microstructural evolution, such as recrystallization and grain growth. In this study, microstructures have been observed in detail by using the SEM/EBSP orientation analyzing system before and after annealing during grain growth in an aluminum foil for electrolytic capacitor. The foil sample after theˆrst annealing had a
doi:10.2464/jilm.52.547
fatcat:g3gw3m2ipba5xmejaolvct3cei