Ti-doped ZnO Thin Films Prepared at Different Ambient Conditions: Electronic Structures and Magnetic Properties

Zhihua Yong, Tao Liu, Tomoya Uruga, Hajime Tanida, Dongchen Qi, Andrivo Rusydi, Andrew T. S. Wee
2010 Materials  
We present a comprehensive study on Ti-doped ZnO thin films using X-ray Absorption Fine Structure (XAFS) spectroscopy. Ti K edge XAFS spectra were measured to study the electronic and chemical properties of Ti ions in the thin films grown under different ambient atmospheres. A strong dependence of Ti speciation, composition, and local structures upon the ambient conditions was observed. The XAFS results suggest a major tetrahedral coordination and a 4+ valence state. The sample grown in a
more » ... le grown in a mixture of 80% Ar and 20% O 2 shows a portion of precipitates with higher coordination. A large distortion was observed by the Ti substitution in the ZnO lattice. Interestingly, the film prepared in 80% Ar, 20% O 2 shows the largest saturation magnetic moment of 0.827 ± 0.013 µ B /Ti.
doi:10.3390/ma3063642 fatcat:sadd5uvx7rfalig2hriigie3pm