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The solution of the problem of amber (succinite) flaw detection by microscopic analysis and luminescent analysis of amber macrostructure is proposed. The proposed method allows to obtain a rapid analysis of the defective state of the material structure. Given the growing demand for the use of such materials on an industrial scale and the insufficiency of existing methods, the proposed method may be a new solution to the problem of flaw detection. The basis of the proposed method for studyingdoi:10.1051/e3sconf/201913801010 fatcat:k7aumqxjpbfyzcvy4frb3dsgam