A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2020; you can also visit the original URL.
The file type is application/pdf
.
A Technique for the Measurement of Hot Spots and Isotherm Profiles at the Surfaces of the Elements of Hybrid Microcircuits
1980
ElectroComponent Science and Technology
A simple technique for measuring surface temperatures with high sensitivity and spatial resolution, which is particularly useful for examining temperature distributions of microcircuits, is described. The invention exploits the well-defined "Isotropic-point" transitions of nematic liquid crystals from optical birefringence to anisotropy, using a polarising microscope to detect temperatures in microscopic areas. Thus hot spots appear black against a bright background. The temperature sensitivity
doi:10.1155/apec.6.177
fatcat:cp353azhdrbahg7vumv7kpreuq