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Spot defects detection in cDNA microarray images
2011
Pattern Analysis and Applications
Complementary DNA (cDNA) microarrays are a powerful high throughput technology developed in the last decade allowing researchers to analyze the behaviour and interaction of thousands of genes simultaneously. The large amount of information provided by microarray images requires automatic techniques to develop accurate and efficient processing. Each spot in the microarray contains the hybridization level of a single gene. One of the most important features of these images are the regularity and
doi:10.1007/s10044-011-0234-x
fatcat:utpihm67qnd2zpqig2k53zup34