TIRF microscopy with ultra-short penetration depth

Hao Shen, Eric Huang, Tapaswini Das, Hongxing Xu, Mark Ellisman, Zhaowei Liu
2014 Optics Express  
Total internal reflection fluorescence microscopy (TIRF), in both commercial and custom-built configurations, is widely used for high signal-noise ratio imaging. The imaging depth of traditional TIRF is sensitive to the incident angle of the laser, and normally limited to around 100 nm. In our paper, using a high refractive index material and the evanescent waves of various waveguide modes, we propose a compact and tunable ultra-short decay length TIRF system, which can reach decay lengths as
more » ... decay lengths as short as 19 nm, and demonstrate its application for imaging fluorescent dye-labeled F-actin in HeLa cells.
doi:10.1364/oe.22.010728 pmid:24921774 fatcat:cx2yj4x7srgc5h4kpezq2tsjv4