Recent advances in MEMS based instrumentation for transmission electron microscopy has paved the way for in situ investigation of materials with unprecedented spatial resolution under high pressures and elevated temperatures. Combined with traditional differentially pumped environmental TEMs, researchers can investigate phenomena such as the melting of nanoparticles, growth of individual graphene layers [1], nanowire [2] and nanotube growth and surface structure of catalytic materials exposed

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... pressures in the range spanning from 10 -8 Pa to atmospheric pressure all at a resolution in the Ångstrøm regime. In addition, newly developed image acquisition equipment, CMOS based and direct electron detection, provides the ideal platform for analyzing the dynamics of nanostructured materials. 902