Исследование поверхности эмиссионно-активных тонкопленочных структур методами зондовой микроскопии и спектроскопии

Александра Галкина, нанотехнологий и телекоммуникаций Санкт-Петербургский политехнический университет Петра Великого. Институт физики, Павел Габдуллин
2019
In the course of this work, surface topography of the thin carbon films and thin molybdenum films was investigated. For thin films of molybdenum, the volt-ampere characteristics of different points of the sample were obtained, and the photosensitivity of islet structures of the sample was studied. According to the current-voltage characteristics, calculations of tunneling spectra were performed.
doi:10.18720/spbpu/3/2019/vr/vr19-3147 fatcat:uwxnwyp5dzh7bawtesxijbzp7m