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Interconnect Coupling-Aware Driver Modeling in Static Noise Analysis for Nanometer Circuits
2004
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
With geometries shrinking in nanometer technologies, crosstalk noise becomes a critical issue. Modern designs like system-on-chips have millions of noise-prone nodes, mandating fast yet accurate crosstalk noise analysis techniques. Using linear circuit model, static noise analysis can efficiently estimate crosstalk noise. Traditionally in static noise analysis, drivers' holding resistances are precharacterized without considering the potential impact of crosstalk noise. However, crosstalk
doi:10.1109/tcad.2004.831568
fatcat:eqt5e7yxpbgq7fqqj4vpa4fl4i