Noninvasive electron microscopy with interaction-free quantum measurements

William P. Putnam, Mehmet Fatih Yanik
2009 Physical Review A. Atomic, Molecular, and Optical Physics  
We propose the use of interaction-free quantum measurements with electrons to eliminate sample damage in electron microscopy. This might allow noninvasive molecular-resolution imaging. We show the possibility of such measurements in the presence of experimentally measured quantum decoherence rates and using a scheme based on existing charged particle trapping techniques.
doi:10.1103/physreva.80.040902 fatcat:477k6ezcwfe5xpfilrjqwa6dj4