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Study on Flux and Alloy of Lead Free Solder with Mitigation Effect and Consideration for Acceleration Test Method
フラックスならびにはんだ合金のはんだウィスカの抑制効果の究明と加速試験法の検討
2012
Journal of The Japan Institute of Electronics Packaging
フラックスならびにはんだ合金のはんだウィスカの抑制効果の究明と加速試験法の検討
We previously researched whisker growth from solder, and reported that whiskers occurred from a non-corroded tin layer that was sandwiched between the non-uniform progressed corroded tin layers in a high-temperature and high-humidity atmosphere. Here, we report further on the results obtained from the EPMA analysis and the electrochemical properties. First, it was ascertained that the corrosion of tin was promoted as bromine in the ux invaded the solder. Furthermore, in addition to the
doi:10.5104/jiep.15.404
fatcat:gf6nn55vz5cijmhw2ml42rdhwa