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Current-to-voltage converters are used in many photometric and radiometric applications. The calibration of current-to-voltage converters at a few input currents is not always sufficient to understand the linearity and the bias of a device. Many devices have structure deviating from a linear response over the operating range of a gain setting. Measurement services that rely on these devices now have decreased uncertainties to a level that requires quantifying the uncertainties and understandingdoi:10.6028/jres.123.019 fatcat:s5zygihtprdj7c3bqf2ruiipry