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The experimentally observed new phenomenon in conducting materialsthe magnetically controlled surface current was examined again with an original measuring method and new silicon samples. The obtained results corroborate very well with the previously acquired data. The proposed registration approach utilizes the nulling compensation technique guaranteeing full offset compensation in all operating modes. The connection of the Ettingshausen effect with the new effect is clear demonstrated. Adoi:10.7546/cr-2013-66-4-13101331-14 fatcat:ejxcyuqmhjc7dnsjjumi3yj7b4