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<p>High temperature exposure of gamma-Al<sub>2</sub>O<sub>3</sub> can lead to a series of polymorphic transformations, including the formation of delta-Al<sub>2</sub>O<sub>3</sub> and theta-Al<sub>2</sub>O<sub>3</sub>. Quantification of the microstructure in the delta/theta-Al<sub>2</sub>O<sub>3</sub> formation range represents a formidable challenge as both phases accommodate a high degree of structural disorder. In this work, we explore the use of XRD recursive stacking formalism fordoi:10.26434/chemrxiv.12584783.v1 fatcat:qqxy7ayfj5ah3cwoektupzz3me