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Fault Classification Research of Analog Electronic Circuits Based on Support Vector Machine
2016
Chemical Engineering Transactions
With the rapid development of microelectronics and semiconductor technology, integrated analog electronic systems become more sophisticated and complex functions. It has become increasingly high reliability requirements, but the corresponding testability positive change it was getting worse. How to use signal processing and artificial intelligence techniques and diagnose faults in the system analog electronic components or subsystems, is currently a hot simulation diagnostics. Fault feature
doi:10.3303/cet1651223
doaj:c6ed97a867d34583a2d9baa2b6482720
fatcat:qpvcaypwwjgcnndclyqzwyhdcq