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The optical constants and thickness of cadmium chalcogenides (CdX, X= S, Se and Te) thin films prepared by quasi close-space sublimation (CdSe) and high-frequency magnetron sputtering method (CdTe and CdS) are determined. The optical constants and the band gap of the films under study have been determined. Optical properties (refractive index n(λ), extinction coefficient k(λ) and dielectric functions ε(λ)) of thin films and thickness d can be determined from the transmission spectrum. Thedoi:10.15330/pcss.20.4.367-371 fatcat:53atn3drirfntmhpec7zaip7ge