Advanced Characterization of Nanoscale Bridge in Magnetic Tunnel Junction by 3-D EDS Tomography

K. Hwang, J. Bae, S. Lee, M. Park, K. Park, J. Choi, J. Ahn, D. Lee, S. Ahn, S. Park, S. Jeong, S. Nam (+3 others)
2013 Microscopy and Microanalysis  
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
doi:10.1017/s1431927613011252 fatcat:yd4zk3ndkrcy3kyhxqc3tomd2i