We investigate the influence of the high voltage scheme elements on the stability of a detector based on a single 10×10 cm^2 area GEM with respect to the secondary discharge occurrence. These violent events pose a major threat to the integrity of GEM detectors and their Front-End Electronics and need to be avoided by any means. For a single GEM setup, we propose a detailed high voltage scheme that is designed to prevent secondary discharges. We determine optimal values of the protection

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... s and parasitic capacitances introduced by cables used in the system. The results of this paper may be used as a guideline for the optimization of more complicated multi-GEM detectors.