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Direct measurement of optical losses in plasmon-enhanced thin silicon films (Conference Presentation)
Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVI
Plasmon-enhanced absorption, often considered as a promising solution for efficient light trapping in thin film silicon solar cells, suffers from pronounced optical losses i.e. parasitic absorption, which do not contribute to the obtainable photocurrent. Direct measurements of such losses are therefore essential to optimize the design of plasmonic nanostructures and supporting layers. Importantly, contributions of useful and parasitic absorption cannot be measured separately with commonly useddoi:10.1117/12.2321030 fatcat:v7z6rtyyb5btxnpcsi3g3p35qe