An adaptive current-threshold determination for IDDQ testing based on Bayesian process parameter estimation

M. Shintani, T. Sato
2013 2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC)  
doi:10.1109/aspdac.2013.6509666 dblp:conf/aspdac/ShintaniS13 fatcat:usjwjuak4zbfnpyt2o4ferx6wi