A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2003; you can also visit the original URL.
The file type is application/pdf.
Direct observation of domain walls in NiFe films using high-resolution Lorentz microscopy
1996
Journal of Applied Physics
Preserved Fulltext
A novel approach to observe the interaction between magnetic domain wall and nanoscale microstructural features is demonstrated. The method is based on Focault mode Lorentz microscopy and utilizes a Gatan energy image filter to provide additional magnification. A postexperimental image processing technique was applied to separate lattice diffraction from that induced by magnetic domains. The effect of NiFe thickness on the width of a 180°Néel wall has been studied. It was found that the
doi:10.1063/1.361972
fatcat:djstqf2efzdonn443phrjkxvom