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Direct observation of domain walls in NiFe films using high-resolution Lorentz microscopy
Journal of Applied Physics
A novel approach to observe the interaction between magnetic domain wall and nanoscale microstructural features is demonstrated. The method is based on Focault mode Lorentz microscopy and utilizes a Gatan energy image filter to provide additional magnification. A postexperimental image processing technique was applied to separate lattice diffraction from that induced by magnetic domains. The effect of NiFe thickness on the width of a 180°Néel wall has been studied. It was found that thedoi:10.1063/1.361972 fatcat:djstqf2efzdonn443phrjkxvom