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This paper deals with the modeling of fault for analog circuits. A two-dimensional (2D) fault model is first proposed based on collaborative analysis of supply current and output voltage. This model is a family of circle loci on the complex plane, and it simplifies greatly the algorithms for test point selection and potential fault simulations, which are primary difficulties in fault diagnosis of analog circuits. Furthermore, in order to reduce the difficulty of fault location, an improveddoi:10.1155/2015/851837 fatcat:et5omnvvrbd3toh4ug3oua7v5m