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Mn doped SnO 2 thin films were prepared by sol-gel dip coating technique. The deposited films on glass substrate were annealed at 300 o C, 400 o C and 500 o C. The effect of annealing temperature on the structure and optical properties of the Mn-SnO 2 thin films have been studied by X-ray diffraction and UV-Vis spectrophotometry. X-ray diffraction studies shows the tetragonal rutile structure of SnO 2 with no additional phases of SnO 2 . Various parameters like crystallite size, latticedoi:10.26438/ijsrpas/v7i2.99107 fatcat:wkppusndczbylllmq3iiythybq