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This paper describes the major concepts of ATML Capabilities and how they are used to describe instrument performance and capabilities, using simple examples and use cases. The paper leads the user through a simple set of increasingly complex problems, at each step describing instrument and test system capabilities in a standard and reusable manner. The paper takes the form of a tutorial, posing and solving increasingly complex instrument description capabilities, with each step clearlydoi:10.1109/autest.2007.4374218 fatcat:gd2jdhjquvc2nehfc5t7dvjnfe