Supplementary material to "Modeling sugar cane yield with a process-based model from site to continental scale: uncertainties arising from model structure and parameter values" [post]

A. Valade, P. Ciais, N. Vuichard, N. Viovy, N. Huth, F. Marin, J.-F. Martiné
2014 unpublished
doi:10.5194/gmdd-7-1197-2014-supplement fatcat:3l7w25g4f5hifm2ft3wdcxdnsu