Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT) is a robust alternative to classical structural ATPG. Due to the powerful reasoning engines of modern SAT solvers, SAT-based algorithms typically provide a high test coverage because of the ability to reliably classify hard-to-detect faults. However, a drawback of SAT-based ATPG is the test compaction ability. In this paper, we propose an enhanced dynamic test compaction approach which leverages the high implicative

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... ower of modern SAT solvers. Fault detection constraints are encoded into the SAT instance and a formal optimization procedure is applied to increase the detection ability of the generated tests. Experiments show that the proposed approach is able to achieve high compaction -for certain benchmarks even smaller test sets than the currently best known results are obtained.