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Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test
2012 13th Latin American Test Workshop (LATW)
Pseudo-exhaustive test completely verifies all output functions of a combinational circuit, which provides a high coverage of non-target faults and allows an efficient on-chip implementation. To avoid long test times caused by large output cones, partial pseudo-exhaustive test (P-PET) has been proposed recently. Here only cones with a limited number of inputs are tested exhaustively, and the remaining faults are targeted with deterministic patterns. Using P-PET patterns for built-in diagnosis,doi:10.1109/latw.2012.6261229 dblp:conf/latw/CookHIMW12 fatcat:euao6arpefafxj3l5jvbn4d36e