Pseudo-exhaustive test completely verifies all output functions of a combinational circuit, which provides a high coverage of non-target faults and allows an efficient on-chip implementation. To avoid long test times caused by large output cones, partial pseudo-exhaustive test (P-PET) has been proposed recently. Here only cones with a limited number of inputs are tested exhaustively, and the remaining faults are targeted with deterministic patterns. Using P-PET patterns for built-in diagnosis,

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... owever, is challenging because of the large amount of associated response data. This paper presents a built-in diagnosis scheme which only relies on sparsely distributed data in the response sequence, but still preserves the benefits of P-PET. Index Terms-Built-in Self-Test, Pseudo-Exhaustive Test, Built-in Self-Diagnosis I.