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The scanning microbeam PIXE analysis facility at NIRS
2003
Nuclear Instruments and Methods in Physics Reseach B
In March 1999, a HVEE Tandetron was installed in the Electrostatic Accelerator Building of National Institute of Radiological Sciences (NIRS) for particle induced X-ray emission (PIXE) analysis. The specifications of the Tandetron accelerator system operating at NIRS are as follows: the accelerating voltage is 0.4-1.7 MV, and the maximum beam current is 500 nA at 3.4 MeV. The accelerator facility incorporates three beam lines for conventional, in-air and microbeam PIXE analysis. The scanning
doi:10.1016/s0168-583x(03)01002-4
fatcat:bga4vbwvrjfczbkvhduuwktlfa