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It is increasingly difficult to guarantee the first silicon success for complex integrated circuit (IC) designs. Post-silicon validation has thus become an essential step in the IC design flow. Tracing internal signals during circuit's normal operation, being able to provide real-time visibility to the circuit under debug (CUD), is one of the most effective silicon debug techniques and has gained wide acceptance in industrial designs. Trace-based debug solution, however, involves non-trivialdoi:10.1109/aspdac.2010.5419883 dblp:conf/aspdac/XuL10 fatcat:5ftlnjsgmbf6ro5vvlufbfvnhq