Test Set Enrichment using a Probabilistic Fault Model and the Theory of Output Deviations

Z. Wangy, K. Chakrabartyy, M. Goessel
2006 Proceedings of the Design Automation & Test in Europe Conference  
We present a probabilistic fault model that allows any number of gates in an integrated circuit to fail probabilistically. Tests for this fault model, determined using the theory of output deviations, can be used to supplement tests for classical fault models, thereby increasing test quality and reducing the probability of test escape. Output deviations can also be used for test selection, whereby the most effective test patterns can be selected from large test sets during time-constrained and
more » ... me-constrained and highvolume production testing. Experimental results are presented to evaluate the effectiveness of patterns with high output deviations for the single stuck-at and bridging fault models.
doi:10.1109/date.2006.244099 dblp:conf/date/WangCG06 fatcat:u5mnc4x4rnd2fltlvffkys6mfy