On test data compression and n-detection test sets

I. Pomeranz, S.M. Reddy
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)  
We consider the relationship between test data compression and the ability to perform comprehensive testing of a circuit under an n -detection test set. The size of an n -detection test set grows approximately linearly with n . Therefore, one may expect a decompresser that can decompress a compressed n -detection test set to be larger than a decompresser required for a compact conventional test set. The results presented in this work demonstrate that it is possible to use a decompresser
more » ... based on a compact one-detection test set in order to apply an n -detection test set. Thus, the design of the decompresser does not have to be changed as n is increased. We describe a procedure that generates an n -detection test set to achieve this result.
doi:10.1109/dac.2003.1219119 fatcat:36cj2xld7nc5nldhqmv2b4keia