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On test data compression and n-detection test sets

I. Pomeranz, S.M. Reddy
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)  

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We consider the relationship between test data compression and the ability to perform comprehensive testing of a circuit under an n -detection test set. The size of an n -detection test set grows approximately linearly with n . Therefore, one may expect a decompresser that can decompress a compressed n -detection test set to be larger than a decompresser required for a compact conventional test set. The results presented in this work demonstrate that it is possible to use a decompresser
more » ... based on a compact one-detection test set in order to apply an n -detection test set. Thus, the design of the decompresser does not have to be changed as n is increased. We describe a procedure that generates an n -detection test set to achieve this result.
doi:10.1109/dac.2003.1219119 fatcat:36cj2xld7nc5nldhqmv2b4keia
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I. Pomeranz, S.M. Reddy. "On test data compression and n-detection test sets." Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)