A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2017; you can also visit the original URL.
The file type is
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451)
We consider the relationship between test data compression and the ability to perform comprehensive testing of a circuit under an n -detection test set. The size of an n -detection test set grows approximately linearly with n . Therefore, one may expect a decompresser that can decompress a compressed n -detection test set to be larger than a decompresser required for a compact conventional test set. The results presented in this work demonstrate that it is possible to use a decompresserdoi:10.1109/dac.2003.1219119 fatcat:36cj2xld7nc5nldhqmv2b4keia