Interferometric characterization of 160 fs far‐infrared light pulses

B. I. Greene, J. F. Federici, D. R. Dykaar, R. R. Jones, P. H. Bucksbaum
1991 Applied Physics Letters  
We report the first interferometric characterization of freely propagating, subpicosecond, far-infrared (FIR) light pulses. FIR light was generated via short pulse photoexcitation of a semi-insulating InP wafer. The half width of the intensity interferogram was 230 fs. The FIR light contained frequency components from 3 to 150 cm -'.
doi:10.1063/1.105268 fatcat:4d7wxp4o65gf3mfvnywljqu4bq