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Preparation and evaluation of microwave dielectric ceramic thick films by aerosol deposition process
Journal of the Ceramic Society of Japan
The objective of this study is to develop microwave dielectric ceramic thick films with a temperature coefficient of the resonant frequency (T cf ) near to zero. Ba 4.2 Sm 9.2 Ti 18 O 54 and TiO 2 fine powders are used as main materials to prepare thick films by aerosol deposition (AD) process. In order to evaluate the dielectric properties of thick films in frequency of microwave region, a new measurement procedure based on resonator techniques using a two-port microstrip ring resonator isdoi:10.2109/jcersj2.116.406 fatcat:ceuwpdpybbekzcyikaxqsutqsu