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Metrology with Unknown Detectors
2016
Physical Review Letters
The best possible precision is one of the key figures in metrology, but this is established by the exact response of the detection apparatus, which is often unknown. There exist techniques for detector characterisation, that have been introduced in the context of quantum technologies, but apply as well for ordinary classical coherence; these techniques, though, rely on intense data processing. Here we show that one can make use of the simpler approach of data fitting patterns in order to obtain
doi:10.1103/physrevlett.116.100802
pmid:27015467
fatcat:cjyej2qqwrhche7ytvcf374ooa