A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2013; you can also visit the original URL.
The file type is application/pdf
.
Encore
2011
Proceedings of the 44th Annual IEEE/ACM International Symposium on Microarchitecture - MICRO-44 '11
To meet an insatiable consumer demand for greater performance at less power, silicon technology has scaled to unprecedented dimensions. However, the pursuit of faster processors and longer battery life has come at the cost of reliability. Given the rise of processor reliability as a first-order design constraint, there has been a growing interest in low-cost, non-intrusive techniques for transient fault detection. Many of these recent proposals have counted on the availability of hardware
doi:10.1145/2155620.2155667
dblp:conf/micro/FengGAMA11
fatcat:uoanodtx4zhslgdz6ygwbykjje