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Proceedings of the 51st Hawaii International Conference on System Sciences
This paper presents a specific process model for Knowledge Discovery in Databases (KDD) projects aiming at availability improvement in manufacturing. For this purpose, Overall Equipment Efficiency (OEE) is analyzed and used, since it is an approved approach to monitor and improve the degree of availability in manufacturing. To define the specific process model, we use the generic CRISP-DM reference model and conduct a mapping for availability improvement. We prove the applicability of our modeldoi:10.24251/hicss.2018.552 fatcat:75edjyvotfdq7n2tsxsaejvx4e