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Scan chain is an architectural solution to facilitate in-field tests and debugging of digital chips, however, it is also known as a source of security problems, e.g. scan-based attacks in the chips. The authors conduct a comprehensive gate-level security analysis on crypto-chips, which are equipped with a scan chain, and then propose a set of protection mechanisms to immune vulnerable nets of the chips against scan-based attacks. After extracting the set of most vulnerable nets, they performdoi:10.1049/iet-ifs.2019.0444 fatcat:5b53w35wqjc3tflloqpmvdc42u