FIELD INDUCED ADSORPTION AT AN AMORPHOUS SILICON SURFACE STUDIED BY FIELD ION MICROSCOPY

H. B. ELSWIJK, G. P.E.M. van BAKEL, J. Th.M. DE HOSSON
1988 Le Journal de Physique Colloques  
Flickering and hopping of spots in the argonimage of an a-SkH layer on tungsten
doi:10.1051/jphyscol:1988634 fatcat:peruovxdzvhrrfvwdr2adsyc3y