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Correlation of X-Ray Microbeam Diffraction Pattern and Substructure by Transmission Electron Microscopy
1975
Journal of the Society of Materials Science Japan
The X-ray microbeam diffraction technique is a powerful method for observation of substructures in metallic materials, because of its ability to measure the microstructural changes in a localized region quantitatively and non-destructively. In recent years, the microstructure in the vicinity of fatigue crack tip has been investigated by using this technique and the mechanism of crack propagation has been discussed based on the results obtained. However, the correlation of the X-ray microbeam
doi:10.2472/jsms.24.2
fatcat:kikhxsv3s5etfhnqjrbk3icm6q