Angle Resolved XPS Study of Thin Oxide Layers Formed on the Surface of Iron-Chromium Binary Alloys Exposed to Air

Shigeru Suzuki, Tomomi Kosaka, Hirobumi Inoue, Yoshio Waseda
1996 ISIJ International  
Recent angle resolved X-ray photoelectron spectroscopy ( AR-XPS ) on the surface of iron-low chromium alloys due to air exposure at room temperature after sputter cieaning has suggested that an oxide layer of nanometer order of magnitude of thickness formed on the ailoys, and a contaminated overlayer covered the oxide layer. In the present work, we havesubsequently studied the surface of iron-chromium al loys containing chromium more than 50masso/o, in order to confirm the previous remarks for
more » ... hese thin oxide iayers on a wider base. Estimation of the effective thickness of these layers by coupling with a model indicates that the thickness of the oxide layer on the surface decreases with increasing chromiumconcentration up to 50masso/o, and is kept almost unchangedwith higher chromium. It is, however, noted that the intensity of metallic peaks in Cr2p XPSspectra still increases with chromiumconcentration more than 50masso/o, and the position of OIs XPSspectra shifts as the chromiumconcentration increases. These facts suggest that the characteristic features of the oxide layers are affected, more or less, by the bulk chromiumcomposition. KEY WORDS: iron~)hromium alloys; oxide layers; oxidation; adsorption; angle-resolved X-ray photoelectron spectroscopy. 1.
doi:10.2355/isijinternational.36.433 fatcat:lt2ynvq7jrb6pp5shv3fwocalu