Determination of metallic impurities on a silicon wafer by the indicator-rod method for liquid-phase dissolution and graphite furnace AAS
液相溶解/黒鉛炉原子吸光法によるシリコンウェハー表面の金属不純物の分析

Hiroyuki NAGASAWA, Yasaburo KATO, Masahisa ENOMOTO
1995 Bunseki Kagaku  
doi:10.2116/bunsekikagaku.44.953 fatcat:o2is3n2q7zeyvfwvo6rarifela