Simple and efficient approach for shunt admittance parameters calculations of VLSI on-chip interconnects on semiconducting substrate

H. Ymeri, B. Nauwelaers, K. Maex, D. De Roest, M. Stucchi, S. Vandenberghe
Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition  
doi:10.1109/date.2002.998468 dblp:conf/date/YmeriNMRSV02 fatcat:slj3pgx6inf5ff5nq2ndr5obhu