Synthesis and Characterization of Nanocrystalline (CdS) 0.6Te0.4 Thin Films Deposited by Closed Space Sublimation Technique

M. S Kale, Y. R Toda, D. S Bhavsar
2014 IOSR Journal of Applied Physics  
The ternary alloy of (CdS) 0.6 Te 0.4 thin films were deposited onto rotating amorphous glass substrates by using closed space sublimation, at a base pressure of 10 -5 torr. The crystalline, morphological, optical and transport properties of the deposited films were studied by using X-Ray Diffraction (XRD), Scanning Electron Microscopy (SEM), UV-VIS-NIR Spectrophotometer, Four Probe method and Thermo Electric Power (TEP) measurement. The XRD exhibits the deposited thin film has polycrystalline
more » ... as polycrystalline nature having monoclinic phase. The dislocation density (δ), strain (ε) and the number of crystallites per unit area (N) have been found to be 2.047 x 10 14 lines / cm 2 , 0.9926 and 9.264 x 10 17 respectively. The SEM reveals the homogeneity of the deposited samples. Optical study performed to estimate optical band gap using absorbance spectra and found to be in the range of 1.6 -2.1 eV. The four probe method estimates the Electrical Resistivity = 0.2045 Ω-cm and Activation Energy = 0.01822 eV. The Fermi energy = 0.2628 eV and Scattering Coefficient = 2.3188 evaluated by using TEP.
doi:10.9790/4861-06222227 fatcat:vlxenskl65aaloh7fxuwgtyqcm