Ternary content addressable memory (TCAM) is one key component in the dedicated hardware modulars for high-performance networking applications. Symmetric and asymmetric cells are two widely used cell structures in TCAMs. An asymmetric cell consists of a binary content addressable memory (BCAM) bit and a mask bit. This paper proposes two march-like test algorithms, ÌÀ Øand ÌÈ , to cover the comparison faults of the BCAM cell and the comparison logic faults of the masking cell. ÌÀ Ørequires 7AE

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... ite operations and (3AE +2 ) Compare operations to cover the comparison faults of an AE¢ -bit TCAM with Hit output only. ÌÈ requires 4AE Write operations and (3AE +2 ) Compare operations to cover the comparison faults of an AE¢ -bit TCAM with priority address encoder (PAE) output. 16th IEEE Asian Test Symposium