A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2017; you can also visit the original URL.
The file type is
Ternary content addressable memory (TCAM) is one key component in the dedicated hardware modulars for high-performance networking applications. Symmetric and asymmetric cells are two widely used cell structures in TCAMs. An asymmetric cell consists of a binary content addressable memory (BCAM) bit and a mask bit. This paper proposes two march-like test algorithms, ÌÀ Øand ÌÈ , to cover the comparison faults of the BCAM cell and the comparison logic faults of the masking cell. ÌÀ Ørequires 7AEdoi:10.1109/ats.2007.4388064 fatcat:zqdjdg56efh4ne2xo5gyhxbpou