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The unambiguous measurement of carrier concentration and mobility in semiconductor nanowires remains a challenging task. This is a consequence of their one-dimensional nature and the incompatibility with Hall or van der Pauw measurements. We propose a method that allows the direct determination of mobility and carrier concentration in nanowires in a contact-less manner. We demonstrate how forward Raman scattering enables the measurement of phonon-plasmon interactions. By applying this method todoi:10.1039/c2nr11910b pmid:22297540 fatcat:aont65bturd2zcysr6e7wup76e