High Resolution Transmission Electron Microscopy and Selected Area Diffraction Study of Doped Zinc Oxide Thin Film

L. Fang, P. Ricou, R. Korotkov
2013 Microscopy and Microanalysis  
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
doi:10.1017/s1431927613011781 fatcat:vo7yccjb6nhnrijkth5t2cnnza