A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2022; you can also visit the original URL.
The file type is application/pdf.
全反射角X線分光法を用いた酸化物超伝導薄膜のin-situ組成分析
In-situ Chemical Analysis of Oxide Superconducting Films by Total-Reflection-Angle X-ray Spectroscopy
1998
Seisan Kenkyu
In-situ Chemical Analysis of Oxide Superconducting Films by Total-Reflection-Angle X-ray Spectroscopy
Preserved Fulltext
