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Multi-anode sawtooth SDD for X-ray spectroscopy fabricated on NTD wafers
2001
IEEE Transactions on Nuclear Science
We are developing a multi-anode sawtooth silicon drift detector (MSSDD) with an anode pitch of 250 m for one-dimensional position-sensitive detection of low-energy X-rays down to 200 eV. The detector is intended to be used in X-ray diffraction analysis. In this paper, we present new results of X-ray spectroscopy measurements with detectors fabricated on neutron transmutation doped (NTD) wafers with a thickness of 290 m. Using an MSSDD with an anode pitch of 250 m and having p + strips on both
doi:10.1109/23.940061
fatcat:q5hlpyk7pfhdtbkii3bedyvqxa