Tools for analyzing large data-set and handling intensity variations of sources with SPI

Laurent Bouchet
2015 Proceedings of 10th INTEGRAL Workshop: A Synergistic View of the High-Energy Sky — PoS(Integral2014)   unpublished
The INTEGRAL/SPI X/gamma-ray spectrometer (20 keV-8 MeV) is an instrument for which it is essential to process many exposures at the same time to increase the low signal-to-noise ratio of the weakest sources and/or low-surface brightness extended emission. The processing of several years of data simultaneously (10 years actually) with traditional methods of data reduction is ineffective and sometimes not possible at all. Thanks to the newly developed tools, processing large data-sets from SPI
more » ... possible with both a reasonable turnaround time and low memory usage. We present also techniques that we have developed to overcome difficulties related to the intensity variation of sources/background between sources between consecutive exposures.
doi:10.22323/1.228.0070 fatcat:zyqqzqhrhjfrpchzbxnld2oavy